Transmission electron microscopy (TEM) is very powerful
technique for materials characterization,
providing information relating to morphology,
composition, and crystal structure. Selected area
diffraction patterns (SADPs) are crystallographic data
that can be obtained using a TEM instrument.
Conventional identification through SADP/TEM is tricky
and tedious, thereby increasing the difficulty
of phase identification. To establish a procedure for
phase identification of known and unknown
phases, in this study we examined two samples: one, a
known phase, being Si with <100> alignment;
the other, unknown, was the TixOy phase at the
96.4Au-3Ni-0.6Ti interlayer/yttria-stabilized zirconia
(YSZ) interface of a steel/96.4Au-3Ni-0.6Ti
interlayer/YSZ joint. The procedures for phase
identification of the known and unknown phases are
described herein using a series of SADPs and
energy dispersive spectrometry within TEMthat would be
useful for general researchers.
Author(s) Details
Kun-Lin Lin
Taiwan Semiconductor Research
Institute, National Applied Research Laboratories, Hsinchu 300, Taiwan.
View Book :- https://bp.bookpi.org/index.php/bpi/catalog/book/238
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