Optical Dispersion: Variation of Refractive Index of Polypyrrole and SnO2 Nanocomposite Thin Film with Incident Wavelength | Chapter 4 | Fundamental Research and Application of Physical Science Vol. 7

 In this study, we examined the dielectric properties of nanocomposite thin films utilizing surface plasmon resonance. The aim search out understand how the excitement wavelength influences the refractive index dispersion curve and to decide the suitability of these films for differing applications. Our findings desire that these nanocomposite thin films exhibit promising dielectric features and could be valuable in optical and photoelectric devices. The alternative in wavelength shows dispersion of the dielectric characteristics of the prepared thin films. The science of surface plasmon resonance (SPR) has happened mostly used in angular interrogation way using monochrome laser light at a established incident awareness. This in turn produce information about the complex dielectric constant and refractive index of the dielectric material painted above the metal surface. In the communication, we present the refractive index dispersal of the prepared composite thin film. A crimson laser light of intuitiveness approximately 633 nm and TM polarisation is exploited to educate the sample surface, and the corresponding reflectivity ranges are recorded for one spectrometer. A complete SPR reflectance curve can be noticed by varying the angular plasmonic pairing conditions, and a complete reflectivity surface R(θ, λ) maybe measured. After weighing the experimental SPR dossier, the complex dielectric constant and refractive index are determined by fitting them with the hypothetical Fresnel equations. In order to do this, a sample of polypyrrole (PPy) and container oxide (SnO2) nanocomposite thin films is groomed by sol-coagulate and spin coating techniques over a golden-coated crystal. The dielectric properties were checked by varying the excitement wavelength of the beginning in the visible range. The refractive index dispersion curve was planned and fitted accompanying the Sellmeier equation to resolve.

Author(s) Details:

Ajay Pratap Singh Gahlot,
Deshbandhu College, University of Delhi, India.

Please see the link here: https://stm.bookpi.org/FRAPS-V7/article/view/11119