This
study discusses the creation and characterisation of monocrystalline dilute
nitride InGaAs(Sb)N and GaAsSbN layers using liquid phase epitaxy (LPE) in the
context of solar applications. The low-temperature form of the LPE method is
utilised to create high-quality epitaxial layers without phase separation.
Scanning electron microscopy is used to characterise the samples' structural
properties. X-ray diffraction measurements, energy dispersive X-ray
spectroscopy, and microscopy Photoluminescence (PL) spectroscopy is used to
investigate the optical bandgap at low and room temperatures. The optical
absorption edge is determined using surface photovoltage spectroscopy (SPV).
The band gap of GaAsSbN is smaller than that of InGaAs(Sb)N in both PL and SPV
spectra, which is important for solar cell applications.
Author(s)
Details
V.
Donchev
Faculty
of Physics, Sofia University, 5, blvd. J. Bourchier, BG-1164, Sofia, Bulgaria.
Dr. M. Milanova
Central Laboratory of Applied Physics, Bulgarian Academy of Sciences, 61,
St. Petersburg blvd., 4000 Plovdiv, Bulgaria.
S. Georgiev
Faculty of Physics, Sofia University, 5, blvd. J. Bourchier, BG-1164,
Sofia, Bulgaria.
View Book :- https://stm.bookpi.org/NUPSR-V7/article/view/1277
Saturday, 5 June 2021
Study of GaAs-Based Dilute Nitride Materials Grown by Liquid Phase Epitaxy | Chapter 4 | Newest Updates in Physical Science Research Vol. 7
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