Pure and doped Polyvinylidene Difluoride (PVDF) films, for
the detection of infrared radiation, have
been well documented using the mechanism of
pyroelectricity. Alternatively, the electrical properties
of films made from Polyvinyl Alcohol (PVA) have
received considerable attention in recent years. The
investigation of surface resistivity of both such
films, to this point, has received far less consideration
in comparison to pyroelectric effects. In this
research, we report temperature dependent surface
resistivity measurements of commercial, and of
multiwall carbon nanotubes (MWCNT), or Agnanoparticle doped PVA films. Without
any variation in the temperature range from 22°C to 40°C with controlled humidity, we found that the
surface resistivity decreases initially, reaches a minimum, but rises steadily as the temperature continues to increase.
Also, we report surface current versus voltage measurements
that indicate a linear result or an Ohm’s law behavior at low voltages, less
than 400 volts while the current exists on the
surface of the dielectric. This research was conducted with the combined instrumentation of the Keithley Model 6517
Electrometer and Keithley Model 8009
resistivity test fixture using both commercial and
in-house produced organic thin films. With the
objective to quantify the suitability of PVDF and PVA
films as IR detector materials, when using the
surface resistivity phenomenon, instead of or in
addition to the pyroelectricity, surface resistivity
measurements are reported when considering bolometry.
We found that the surface resistivity
measurements on PVA films were readily implemented.
Author
(s) Details
Matthew Edwards
Department of Physics, Chemistry & Mathematics, Alabama
A&M University, Normal, AL, USA.
Stephen Egarievwe
Department of Engineering, Construction Management &
Industrial Technology, Alabama A&M University, Normal, USA.
Afef Janen
Department of Physics, Chemistry & Mathematics, Alabama
A&M University, Normal, AL, USA.
Tatiana Kukhtarev
Department of Physics, Chemistry & Mathematics, Alabama
A&M University, Normal, AL, USA.
View Book :- https://bp.bookpi.org/index.php/bpi/catalog/book/235
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