Piezoelectric materials have been widely used in the
automotive, medical instrument, information and telecommunication industry as
sensors, actuators, frequency controlling devices, and high voltage and power
sources. Piezoelectric devices make use of direct and inverse piezoelectric
effects to perform a function. Both these piezoelectric effects are found in
the crystal structures of some materials. The bottleneck of the piezoelectric
devices in miniaturization is the heat generation owing to the losses. There
are three losses in a piezoelectric material: dielectric, elastic and
piezoelectric losses. The development of high-power-density piezoelectrics is
directly relevant to the clarification of the loss mechanisms in such
materials. This study describes the characterization methodologies of
high-power piezoelectrics, in particular, in determining the three losses
separately. ‘Intensive’ and ‘extensive’ losses are introduced in this study.
Two broad categories of measurement techniques are discussed: (1) electrical
excitation method, and (2) mechanical excitation method. The former is
basically admittance/impedance measurement via the output current over the
input voltage, further classified into four methods: (a) constant voltage, (b)
constant current, (c) constant vibration velocity, and (d) constant input
energy. To the contrary, the latter is basically the transient mechanical
vibration ring-down measurement under various electrical constraint conditions.
The key is to obtain precise values of both mechanical quality factors at
resonance QA and at antiresonance QB, regardless of measuring techniques, so
that we can determine the piezoelectric loss precisely. The difference of QM
between the resonance and antiresonance originates from the electromechanical coupling
factor k2 loss, (𝑘2″𝑘2′) = (2 tan 𝜃'
- tan 𝛿'
- tan 𝜙')
Depending on the sign of the k2 loss, more efficient driving frequency can be
derived rather than the conventional “resonance’ frequency. Recent studies on
the loss determination methodology were also added in this study.
Author(s) Details
Kenji Uchino
International Center for Actuators and Transducers, The Pennsylvania State
University, University Park, PA, USA.
Please see the book here:- https://doi.org/10.9734/bpi/psniad/v2/6033
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