Metal chalcogenide thin films have fascinated the attention of many scientists by way of unique ocular, physical and electric features. Characterization of the prepared films has existed carried out by using various tools. In this work, strength dispersive X-ray analysis (EDX) was used to investigate the compositional of samples. The EDX analyst was equipped accompanying the scanning electron microscopy for fast identification of source. Experimental results displayed that the presence of various elements in particular sample was contingent upon the experimental environments. Research findings also emphasize different stoichiometric characteristics could be observed in the as-located film and annealed samples. The samples prepared under optimum compositional ratios showed better semantic and structural presence.
Author(s) Details:
Ho Soonmin,
Faculty
of Health and Life Sciences, INTI International University, Putra Nilai-71800,
Negeri Sembilan, Malaysia.
Please see the link here: https://stm.bookpi.org/NFPSR-V5/article/view/8854
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