Thin films of Copper Zinc Sulphide (CuxZn1-xS) were prepared and deposited using the technique of metal organic chemical vapour deposition (MOCVD). The films were analysed using Rutherford backscattering (RBS) elemental composition and thickness spectroscopy, crystallographic structure X-ray diffraction (XRD), surface morphology scanning electron microscopy (SEM) and Ultraviolet-Visible optical characterization spectroscopy analysis. Experimental findings revealed that all the films were polycrystalline with strong substrate adherence. For different values of x, the direct optical band gap increases from 2.20 eV to 3.42 eV with an average transmittance above x. Eighty percent. SEM research showed that with well specified grains of various sizes, the deposited films are dense in nature. The analysis shows that the properties of the films deposited were highly affected by the concentrations of copper / zinc in the matrix CuxZn1-xS. The results obtained indicate that the deposited films can be used in various optoelectronics applications, such as thermal control, Cold climate window coatings, anti-reflection coatings, light emitting products, as well as solar cell heterojunctions. In particular, another method of depositing thin copper zinc sulphide films for industrial applications was given in this report.
Author (s) Details
Joseph Onyeka Emegha
Department of Physics, University of Benin, Benin City, Edo State, Nigeria.
Bolutife Olofinjana
Department of Physics and Engineering Physics, Obafemi Awolowo University, Ile-Ife, Nigeria.
Marcus Adebola Eleruja
Department of Physics and Engineering Physics, Obafemi Awolowo University, Ile-Ife, Nigeria.
Samuel Ogochukwu Azi
Department of Physics, University of Benin, Benin City, Edo State, Nigeria.
Frank Ochuko Efe
Department of Physics and Engineering Physics, Obafemi Awolowo University, Ile-Ife, Nigeria.
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