Structural, Morphological, and Optical Study of the Fe-doped ZnO Thin Film | Chapter 1 | Current Perspective to Physical Science Research Vol. 7

Fe-doped ZnO Dilute Magnetic Semiconductor (DMS) thin film prepared by R F magnetron sputtering on a glass substrate and the Influence of Fe-doping at 3% on structural, morphological, and optical properties has been studied. The X-ray Diffraction (XRD) analysis shows that Fe doping has a significant effect on crystalline structure, grain size, and strain in the thin film. Crystalline structure is obtained for 3% Fe doping as observed from Atomic Force Microscopy (AFM) and X-ray Diffraction (XRD). UV-visible spectroscopy was used to study the optical behavior of the thin films.

Author(s) Details:

Arun Kumar,
Ion Beam Centre, Department of Physics, Kurukshetra University, Kurukshetra-136119, India.

Sanjeev Aggarwal,
Ion Beam Centre, Department of Physics, Kurukshetra University, Kurukshetra-136119, India.

Mahavir Singh,
Department of Physics, Himachal Pradesh University, Shimla-171005, India.

Please see the link here: https://stm.bookpi.org/CPPSR-V7/article/view/13445