Statistical process control (SPC) charts are important tools
for detecting process shifts. SPC enables operations to run smoothly and
consistently produce goods that meet quality standards. It is widely used in
manufacturing and can also be applied to any process where quality and change
monitoring are priorities, including in service industries, environmental
management, economics, healthcare, and more. The control chart is an important
statistical technique that is used to monitor the quality of a process. The
most accepted control charts are the Shewhart charts, CUSUM charts and the EWMA
charts. Shewhart control charts help to detect larger shifts in the process
parameters, but Cumulative Sum (CUSUM) and Exponentially Weighted Moving
Average (EWMA) charts are expected for smaller and moderate changes. The CUSUM
control chart is normally used in industry for the result of small and moderate
shifts in process stability and disparity. It can be shown that if there are
sharp, irregular changes to a process, these types of charts are highly
effective. On the other hand, if one is involved in a small, persistent shift
in a process, other types of control charts may be chosen, for instance, the
CUSUM control chart. In this study, a Self-Starting CUSUM control chart was
used for monitoring the moisture level of the paper sheet. For monitoring the
process, 30 samples were collected from the ongoing process. The results
demonstrate that CUSUM charts can detect process shifts as early as the 21st
observation, whereas traditional Shewhart charts showed no change. This early
detection can help the decision maker to proactively respond to the output and
correct the problems in time. The Self-Starting – CUSUM chart is very easy to
use, and it quickly detects both small and large shifts in the process mean and
/or standard deviation.
Author(s) Details
S. Subbulakshmi
Department of Statistics, Shri Krishnaswamy College for Women, India.
A. Kachimohideen
Department of Statistics, Periyar E. V. R. College, India.
Please see the book here :- https://doi.org/10.9734/bpi/mcsru/v7/6431
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