Showing posts with label ADC. Show all posts
Showing posts with label ADC. Show all posts

Friday, 29 March 2024

Various Ultrasound Beamformer Designs and Architectures: An Update | Chapter 5 | Theory and Applications of Engineering Research Vol. 7

 A medical ultrasound scanner is a complex digital signal processing system, and it has sophisticated transmitter and receiver signal processing chain. The receive signal processing chain involves many complex signal processing functions, and among them the most complex and significant is the digital beamformer. The beamformer can be considered as the brain of whole signal processing system of the scanner. Beamforming allows message transmission or reception to be directed or spatially selective. It is used in receive signal processing to concentrate the signals of interest in the region of concern as reflections from various tissue structures. As beamformer is the complex signal processing engine in a scanner, practical implementation of the same has significant challenges. This chapter provides an insight of the various receive beamformer architectures implemented in field programmable gate array (FPGA)/application specific integrated circuit (ASIC) for ultrasound imaging.

 

Most of the receive beamformers are implemented using the standard technique delay and sum (DAS). Beamforming in ultrasound instruments for medical imaging has traditionally been implemented using analog delay lines. The concept of dynamic focusing in near field has resulted more complex analog delay structures and were replaced by digital structures. By the availability of high-speed analog to digital converters, and very large-scale integrated circuit (VLSI) technology improvements have now made real time implementation of digital beamformers feasible. The current innovations involve hybrid beamformers utilizing the pros of both analog and digital structures. This chapter discusses the evolution of beamforming architectures from analog to digital environment and the recent trends in beamformer realizations including parallel beamformer implementations. The changes in beamformer designs in order to be compatible to high frequency sensor arrays and yield improved imaging performance, resource optimization, etc. are briefed.


Author(s) Details:

Sreejeesh S. G.,
VLSI Department, National Institute of Electronics and Information Technology, Calicut, India.

Sakthivel R.,
Sense School, Vellore Institute of Technology, Vellore, India.

Jayaraj U. Kidav,
Department of Electronics, National Institute of Electronics and Information Technology, Aurangabad, India.

Please see the link here: https://stm.bookpi.org/TAER-V7/article/view/13684

Thursday, 1 June 2023

Multifunctional Device for Measuring and Monitoring Parameters of a Photovoltaic Module | Chapter 12 | Research and Developments in Engineering Research Vol. 4

 In this work, analyzes of existing devices for measuring the current-voltage characteristic were carried out in order to compare several devices. The purpose of this work is to develop a device for measuring the current-voltage characteristics of photovoltaic modules and the environmental factors affecting them. The paper discusses a system for monitoring solar module parameters that measure air temperature, module temperature, solar radiation, wind speed, current-voltage characteristic, maximum power point (MPP), efficiency, and fill factor (FF) and stores the data in a computer. The system is constructed around a programmable microcontroller with an analog-to-digital converter built in. The suggested system's program code also includes an algorithm for determining the maximum power point of the solar module. Because every parameter are taken into account automatically and written to the computer in the form of tables, the system performs all measurements in real time and is simple to use.  In order to compare the suggested monitoring system with alternative commercial measuring equipment, the research looked at their properties. The proposal includes a circuit diagram for a monitoring system as well as an electrical circuit to measure current-voltage characteristics.

Author(s) Details:

Davronov Shokhjakhon,
Department of Software Engineering, Karshi Branch of the Tashkent University of Information Technologies Named after Muhammad al-Khwarizmi, Karshi, Uzbekistan.

Please see the link here: https://stm.bookpi.org/RADER-V4/article/view/10749