Faults Classification in Analog Circuits Using Nearest Neighbours of Fault Variables | Chapter 10 | Emerging Trends in Engineering Research and Technology Vol. 8

 Faults classification using nearest neighbour estimate of fault variables of circuit under test (CUT) is

proposed. Fault variables corresponding to the components of CUT are found from the fault free,
faulty circuit parameters and test vectors of the components. The proposed method does not require
any test point or node selection techniques for fault diagnosis. The faults classification technique is
tested using benchmark circuits like Sallen Key Band Pass Filter.

Author(s) Details

Dr. G. Puvaneswari
Department of ECE, Coimbatore Institute of Technology, Coimbatore, India.

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