P-type multi-crystalline PERC silicon solar cells are
susceptible to strong light- and elevated temperature-induced degradation
(LeTID). This effect can cause more than significant power loss over several
years of module operation in the field. Various approaches, such as illuminated
annealing and modified thermal processes, have been investigated to suppress
LeTID. An undesirable side effect of these processes is an increased contact
resistance at the front screen-printed metal fingers, and therefore a lower
fill factor (FF), which is the ratio of maximum obtainable power to the product
of the open-circuit voltage (VOC) and short-circuit current (ISC) of a solar
cell device, and the subsequentially its energy conversion efficiency. Previous
work has indicated that this may be caused by the transport and accumulation of
hydrogen at the metal contacts and that this behaviour can be limited by
applying a reverse bias across the cell during a thermal anneal in the dark. In
this work, we have conducted a similar biased annealing process to investigate
the effect of different cooling conditions on PERC cell performance and
developed a biased annealing treatment that not only improves the efficiency
but also maintains the stability during the light soak test. Preliminary
results of transferring this process into 6-inch PERC cells using a full-scale
industrial tool are also presented.
Author(s)details:-
Li Wang
School of Photovoltaic and Renewable Energy Engineering, University of
New South Wales, Kensington, NSW, Australia.
Phillip
Hamer
School of Photovoltaic and Renewable Energy Engineering, University of
New South Wales, Kensington, NSW, Australia.
Michael
Pollard
School of Photovoltaic and Renewable Energy Engineering, University of
New South Wales, Kensington, NSW, Australia.
Catherine
Chan
School of Photovoltaic and Renewable Energy Engineering,
University of New South Wales, Kensington, NSW, Australia.
Please See
the book here :- https://doi.org/10.9734/bpi/crpps/v1/8188E
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