Showing posts with label Ion irradiation. Show all posts
Showing posts with label Ion irradiation. Show all posts

Thursday, 3 April 2025

Comparative Modifications Induced by Two Swift Heavy Ions (SHIs) of 50 MeV Li+3 and 80MeV C+5 on the Structural, Optical and Chemical Properties of Self-Supporting ABS Film | Chapter 2 | Chemical and Materials Sciences: Developments and Innovations Vol. 7

This paper deals with the modifications in self-supported films of acrylonitrile butadiene styrene (ABS) before and after irradiation. These films were irradiated with 50 MeV Li+3 and 80 MeV C+5 ions at different fluences (i.e. 3 × 1010, 1 × 1011, 1 × 1012 and 1 × 1013 ion cm-2). Scientific explanations of various properties e.g. structural, optical properties and chemical studies of ABS before and after ion beam irradiation are discussed. ABS thick film is considered as one of the ultimate promising optoelectronic materials due to its large band gap (Eg = 3.88 eV) at room temperature and also one of the functional materials with a huge range of applications due to its unique optical and structural properties. The irradiation also leads to the formation of free radicals and the formation of the modified structure by reunion of the free radicals to other active sites which causes an increase in the molecular mobility. Therefore, the obtained result may show that it is of great importance to line these changes with some dosimetry.

 

Author (s) Details

Veena Joshi
Department of Chemistry, H.N.B Garhwal University, SRT Campus Badshahi Thaul, Tehri Garhwal 249199, India.

 

Madhu Lata Bharti
Department of Chemistry, H.N.B Garhwal University, SRT Campus Badshahi Thaul, Tehri Garhwal 249199, India.

 

Please see the book here:- https://doi.org/10.9734/bpi/cmsdi/v7/2793

Wednesday, 2 March 2022

Ion Irradiation Effect on Structure and Magnetic Properties of Multilayer Fe/Si | Book Publisher International

 This book was written in the hopes that readers, particularly young researchers and students, would be able to learn more about how Argon ion irradiation affects multilayer thin film systems, with a focus on Fe/Si metal-semiconductor systems, and how it is linked to magnetoresistance (MR) properties. This issue is significant because it covers the phenomena of physical characteristics, which are crucial in comprehending MR phenomena at the nanoscale scale. The Helicon Sputering technique is used to create thin films with thicknesses in the nanoscale range, a technology that allows for extremely precise film creation. Furthermore, it can be demonstrated that ion irradiation has an effect on MR characteristics, which can be linked to the interfacial structure between the Fe and Si layers. Several characterization techniques, such as Conversion Electron Mossbauer Spectroscopy (CEMS), Rutherford Back Scattering (RBS), and confirmation with Vibrating Sample Magnetometer(VSM) and Four Point Probe(FPP) for the magnetic and MR properties of post-irradiated thin film systems, can clarify this effect. This book can add to our understanding of how ion irradiation alters the physical properties of thin films and reduces the sensitivity of thin-film sensors like magnetic sensors.

The book is divided into five chapters, the first of which is an introduction to the current state of research on the GMR phenomena in multilayer Fe/Cr and Fe/Si. In Chapter 2, we discussed the basic theory of GMR in multilayer and exchange interactions, as well as the synthesis process of Helicon plasma Sputtering. In Chapter 3, we discussed the materials, synthesis methods, and characterization of multilayer films. In Chapter 4, we went through the pre-irradiation and post-irradiation of Argon ions in relation to the Fe/Si multilayer and its structure model in great depth. The conclusion concerning the influence of ion irradiation on the structure and magnetic characteristics of multilayer Fe/Si is found in Chapter 5.

Author(s) Details

Setyo Purwanto
National Agency for Research and Innovation (BRIN), Puspiptek, Serpong 15314, Tangerang Selatan, Banten Provence, Indonesia.

View Book:- https://stm.bookpi.org/IIESMPM/article/view/5944